ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,722, issued on June 23, was assigned to Georgia Tech Research Corp. (Atlanta). "System and method to control defects in projection-based su... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,723, issued on June 23, was assigned to FUJIFILM Corp. (Tokyo). "Washout processor and washing method" was invented by Masato Shirakawa (Ha... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,724, issued on June 23, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Lithography system with non-invasiv... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,725, issued on June 23, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Methods and systems to calibrate reticle thermal e... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,726, issued on June 23, was assigned to ASML NETHERLANDS B.V. (Veldhoven, Netherlands) and CYMER LLC (San Diego). "Optimization of lithogra... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,727, issued on June 23, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Method for correcting measurements in the manufact... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,728, issued on June 23, was assigned to KLA Corp. (Milpitas, Calif.). "Oblique illumination for overlay metrology" was invented by Andrew V... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,729, issued on June 23, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "On chip sensor for wafer overlay measurement" was ... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,730, issued on June 23, was assigned to Onto Innovation Inc. (Wilmington, Mass.). "Front-to-back overlay (FTBO) standard" was invented by K... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,731, issued on June 23, was assigned to CANON K.K. (Tokyo). "Exposure apparatus, exposure method, and article manufacturing method" was inv... और पढ़ें